Library
You will find here a variety of technical publications involing BestESD staff as authors (with one exception). The papers are in no particular order of significance or subject matter.
3M ESD Instrumentation Leader Gives Technical Papers at Two Asia Conferences - 3M Static DigestSee page 8
A Comparison of High-Frequency Voltage, Current and Field Probes and Implications for ESD/EOS/EMI Auditing - ESD Symposium, 2007Can Mobile Phones damage GMR Heads by Electromagnetic Interference (EMI)? ESD Symposium, 2000Controlling ESD Damage of ICs at Various Steps of Back-End Process - ESD Symposium, 2001Effective Management Of An ESD Environment In Production - Conformity, April 2003Electromagnetic Field Induced Degradation of Magnetic Recording Heads in a GTEM Cell - ESD Symposium, 2006EMI and Equipment Malfunction in Cleanroom Environment - Sematech ESD Workshop, 2000EMI Issues in Semiconductor Manufacturing Environment - Taiwan ESD Symposium, 2006EMI Issues in the Manufacturing Environment - Conformity, January 2007EMI/ESD and Tool Uptime - Sematech ESD Workshop, Semicon West, 2002EOS Exposure of Magnetic Heads and Assemblies in Automated Manufacturing - ESD Symposium, 2005ESD and EOS Exposure of Sensitive Components in Today's Manufacturing Process - Philippines\' ESD Forum, March 2005
ESD Diagnostics Tools and Methodology - InCompliance Magazine, February 2010This article published in February 2010 edition of InCompliance Magazine focuses on methodology, techniques and tools to identify, classify and quantify ESD occurrences in back-end semiconductor and electronics assembly manufacturing.
ESD Exposure to Sensitive Devices During Device Packaging and Assembly - Taiwan ESD Symposium, 2007Named one of the best papers of the Symposium
ESD Problem Diagnostics in IC and PCB Assembly - Conformity, April 2009ESD Risks and Management in SMT Manufacturing: Part I - SMT Newsletter, June 2009ESD Risks and Management in SMT Manufacturing: Part II - SMT Newsletter, June 2009ESD: The Discharge part of Electrostatic Discharge - Sematech ESD Workshop, 2000ESDA Volunteer Spotlight - Vladimir KrazFacilities Electrical Grounding Audit, Sematech ESD Workshop, 2001Written by Patrick Gagnon, Texas Instruments, and presented at Sematech ESD Workshop, 2001
Grounding and Reliable Operation of Equipment - ERI News, May 2007See page 2
How to Choose ESD Test Equipment - The BestTest Newsletter, November 2004, vol.8, number 22How Good is Your Ground - Evaluation Engineering MagazineHuman Body vs. Charged Device Models - 3M Static DigestSee pages 4 and 5 in this document
Monitoring of ESD Exposure to Components in IC Handlers - RCJ Conference, Tokyo, November 2002Near-Field Methods of Locating EMI Sources - Compliance Engineering Magazine, May-June, 2005Notes on Maintaining Sub-1V Balance of an Ionizer - ESD Symposium, 2004Origins of EOS in Manufacturing Environment and Its ClassificationPresented at ESD Symposium in 2009 in Anaheim
Quantitative monitors minimize cost impact of ESD events on GMR heads - Cleanrooms Magazine June 2005Tech Corner: How to Measure Ground the Right Way - 3M Static DigestSee pages 6..8
The effects of EMI from cell phones on GMR magnetic recording heads and test equipment - Journal of Electrostatic, Issue 54, 2002The Importance of Being Grounded - IPC Design Council' Route Magazine, June 2008Verification of ESD Environment in Production - Presented at University of Milan, 2002Il Controllo dell’Elettricità Statica, Milano 29 Ottobre 2002. Giornata ASCCA dedicata al Controllo dell’Elettricità Statica
Why Bad ESD Happens to Good Chips? - Philippines' ESD Forum, 2007
